Carbon nanotubes veils are sheets of non-woven entangled carbon nanotubes (CNTs) which have exhibited substantial property improvements, such as Young’s modulus and electrical conductivity, when uniaxial strains are applied to the veil causing the CNTs to align within the veil [1, 2]. Due to the importance that the alignment plays in the performance of the veils, it is critical to quantify the alignment of CNTs in veils. This work develops a method of applying a two-dimensional Fourier transform (2D-FFT) on scanning electron micrographs to calculate the orientation of CNTs in pre-formed arrays such as veils. From this 2D-FFT an orientation distribution function and the associated Herman parameter were calculated. The method was used to evaluate the orientation of veils that had been pre-strained to 5%, 10% and 16%. The algorithm developed showed the increased strain in the orientation distribution function and calculated an increasing Herman’s parameter with increased pre-strain. To further validate the algorithm the measurement was compared to polarized Raman spectroscopy, a common method used to calculate orientation of CNTs [3, 4]. The orientation maps produced by both methods were in good agreement with both identifying areas of higher orientation in the same locations of the mapped area. Following the alignment of the CNT veil, the veil was impregnated with an epoxy composite to produce the CNT veil epoxy composite with improved mechanical properties from increased alignment of CNTs in the array. References: 1. A.E. Aliev et. al; Carbon, 2007, 45: 2880-2888 2. L. Zhang; G. Zhang; C. Liu; S. Fan; Nano Lett, 2012, 12(9): 4848-4852 3. W. Liu et al.; Carbon, 2011, 49(14): 4786–4791 4. X. Wang et. al.; Mater. Res. Letters, 2013, 1(1): 19–25